Central Facilities

NCMN Central Facility for Electron Microscopy

The function of the Central Facility for Electron Microscopy is to provide hands-on access to electron microscopes, sample preparation equipment plus data collection and data reduction instrumentation, along with advice, training and research collaboration. The scope of the Facility is materials characterization of the topography, morphology, elemental composition, crystalline microstructure, crystal defects, and atomic arrangements of materials, largely on a scale from 10 micrometers down to the near-atomic level.
 -EM Research Services
FEI Tecnai Osiris
schedules for
FEI Tecnai Osiris S/TEM
FEI Nova NanoSEM
Specimen Preparation

(1) FEI Tecnai Osiris (S)TEM

Fully digital 200 kV TEM and STEM system including the HAADF detector X-FEG
high brightness Schottky FEG. 
Super-X windowless EDX detector and EELS system. Biprism for holography
and tomographic holder.

(2) FEI Nova NanoSEM450

Field emission SEM with ultra-stable, high current Schottky gun. Advanced optics and detection, including immersion mode, beam deceleration, in-lens TLD-SE and -BSE, DBS and STEM for best selection of the information and image optimization.

(3) JEOL JEM 2010 TEM

200kV, analytical/high-resolution mode, LaB6 filament, single-tilting and double-tilting sample holders. (Oxford EDS system, Gatan dual-view CCD camera, TSL texture analysis system, Digi-TEM beam control system).

(4) Specimen Preparation Equipment

Various  equipment for TEM and SEM specimen preparation, including slow speed diamond/wire saw; ultrasonic/rotation disc cutter; dimpling grinder; metallurgical polishing wheel; ion-polishing PIPS/PIPS II; plasma nanoclean; Au/C sputter coater.

Users of the facility:

The Facility is accessible to all qualified researchers at UNL, at other universities and in industrial and other laboratories on payment of the appropriate charges.

Under normal circumstance, these researchers will be expected to have the requisite background knowledge for electron characterization of materials before some training will be given for a particular instrument.

In some cases, research collaboration is possible for common research interests and/or if researchers need the capabilities of the equipment and experienced examination of samples but are unable to use the facilities for themselves. Limited full service handling and examination of materials is available for these researchers according to availability of the facility specialist.

2011 equipment in EM Facility   VCR Group IncDimplerD 500i       Allied multiprep Grinding           Gatan 691 PIPS       

Specimen preparation devices

  • Allied multiprep lapping and grinding machine
  • Branson ultrasonic cleaner 2200
  • Buehler Isomet slow speed saw
  • Cressington Au sputter coater
  • Cressington Carbon coater
  • Fischione ultrasonic disc cutter
  • Fischione plasma nanoclean
  • Gatan PIPS 691
  • Gatan PIPS II 695
  • Gatan dimple grinder 656    
  • Intek optical microscope
  • Leica stereo microscope ZOOM 2000
  • SBT lapping and polishing machine 910
  • SBT rotation cutter 360
  • VCR Group Inc. Dimpler D500i  


Nebraska Center for Materials and Nanoscience

                        Dr. Xingzhong “Jim” Li, Specialist

                        Dr. Xingzhong “Jim” Li, Specialist 

Electron Microscope FEI


Electron Microscope


New NCMN Facilities Sign-In Calendar 

     Check with the Specialist for log-in access 


Xingzhong Li,  Facility Specialist (primary)

855 N. 16th Street,
Jorgensen Hall, Room 033
Lincoln, NE 68588-0298

phone: (402) 472-8762
   fax: (402) 472-6148

Lanping Yue ,  Facility Specialist (secondary)

855 N. 16th Street, 
Jorgensen Hall, Room 013
Lincoln, NE 68588-0298

phone: (402) 472-2742
   fax: (402) 472-6148

Jiong Hua,  Facility Specialist (tertiary)

855 N. 16th Street, 
Nanoscience Reseach Center, Room 102B
Lincoln, NE 68588-0298

phone: (402) 472-3773
   fax: (402) 472-6148

Jeff Shield, Faculty Advisor

W339 Nebraska Hall
University of Nebraska
Lincoln, NE 68588-0656

Phone: (402) 472-2378