Central Facilities

CFEM Facility
Electron Microscopy

About the Facility

The function of the Central Facility for Electron Microscopy is to provide hands-on access to electron microscopes, sample preparation equipment plus data collection and data reduction instrumentation, along with advice, training and research collaboration. The scope of the Facility is materials characterization of the topography, morphology, elemental composition, crystalline microstructure, crystal defects, and atomic arrangements of materials, largely on a scale from 10 micrometers down to the near-atomic level.


Tecnai Osiris
1. FEI Tecnai Osiris (S)TEM

Fully digital 200 kV TEM and STEM system including the HAADF detector X-FEG high brightness Schottky FEG. Super-X windowless EDX detector and EELS system. Biprism for holography and tomographic holder.

FEI Nova NanoSEM450
2. FEI Nova NanoSEM450

Field emission SEM with ultra-stable, high current Schottky gun. Advanced optics and detection, including immersion mode, beam deceleration, in-lens TLD-SE and -BSE, DBS and STEM for best selection of the information and image optimization.

3. JEOL JEM 2010 TEM

200kV, analytical/high-resolution mode, LaB6 filament, single-tilting and double-tilting sample holders. (Oxford EDS system, Gatan dual-view CCD camera, TSL texture analysis system, Digi-TEM beam control system).

4. Specimen Preparation Equipment

Various equipment for TEM and SEM specimen preparation, including slow speed diamond/wire saw; ultrasonic/rotation disc cutter; dimpling grinder; metallurgical polishing wheel; ion-polishing PIPS/PIPS II; plasma nanoclean; Au/C sputter coater. Specimen preparation devices include:

  • Allied multiprep lapping and grinding machine
  • Branson ultrasonic cleaner 2200
  • Buehler Isomet slow speed saw
  • Cressington Au sputter coater
  • Cressington Carbon coater
  • Fischione ultrasonic disc cutter
  • Fischione plasma nanoclean
  • Gatan PIPS 691
  • Gatan PIPS II 695
  • Gatan dimple grinder 656
  • Intek optical microscope
  • Leica stereo microscope ZOOM 2000
  • SBT lapping and polishing machine 910
  • SBT rotation cutter 360
  • VCR Group Inc. Dimpler D500i
Allied Multiprep Grinding
Allied multiprep lapping and grinding machine
Gatan 691 PIPS
Gatan 691 PIPS
VCR Group Inc DimplerD 500i
VCR Group Inc DimplerD 500i

Users of the facility

The facility is accessible to all qualified researchers at UNL, at other universities and in industrial and other laboratories on payment of the appropriate charges.

Under normal circumstance, these researchers will be expected to have the requisite background knowledge for electron characterization of materials before some training will be given for a particular instrument.

In some cases, research collaboration is possible for common research interests and/or if researchers need the capabilities of the equipment and experienced examination of samples but are unable to use the facilities for themselves. Limited full service handling and examination of materials is available for these researchers according to availability of the facility specialist.

Facility Contacts

Xingzhong Li
Facility Specialist (primary)
033 Jorgensen Hall
Phone: 402-472-8762
Xingzhong Li
Xingzhong "Jim" Li
Lanping Yue
Facility Specialist (secondary)

013 Jorgensen Hall
Phone: 402-472-2742
Lanping Yue
Lanping Yue
Jiong Hua
Facility Specialist (tertiary)

102B Jorgensen Hall
Phone: 402-472-3773
Jiong Hua
Jiong Hua
Jeff Shield
Faculty Advisor

W339 Nebraska Hall
Phone: 402-472-2378

Jeff Shield
Jeff Shield