JEOL 2010 TEM

JEOL 2010 Hi-Resolution Transmission Electron Microscope

The JEOL 2010 Hi-Resolution Transmission Electron Microscope (HRTEM) is used for extremely high-magnification studies of materials. It's superior resolution makes it ideal for imaging materials on the atomic scale. This is the ONLY microscope of its type between Arizona and Illinois.

Some facts about the HRTEM:

  • Accelerating voltage: 200 kV
  • Resolution: ~ 1.94 Å
  • Vacuum system operates in the 10-9 Torr range
  • 10° maximum tilt angle in goniometer
  • Single and double tilt stages
  • Capable of Bright-Field, Dark-Field, Hi-resolution, SAED and CBED imaging
  • Currently uses SO163 electron film

HRTEM

 

        HRTEM sample results:

 

Nickel particles Nickel particles surrounded by a polymer matrix.

 

Electron Diffraction Pattern Electron Diffraction Pattern

 

Learn more about Transmission Electron Microscopes (TEM)