JEOL JEM2010 200kV Transmission Electron Microscope

The JEOL JEM2010 200 kV Transmission Electron Microscope is equipped with Gatan Erlangshen CCD camera and high-defination video recording software, which is used electron diffraction technique and in situ TEM for study of materials science. 

Learn more about Transmission Electron Microscopes (TEM).

Some facts about the JEM2010:
  • Accelerating voltage: 200 kV
  • Vacuum system operates in the 10-9 Torr range
  • 25° maximum tilt angle in goniometer
  • Single and double tilt stages
  • Capable of Bright-Field, Dark-Field imaging, SAED and CBED electron diffraction.
  • Currently uses CCD camera
TEM image and electon diffaction pattern:
Nickel particles
Nickel particles surrounded by a polymer matrix
Electron Diffraction Pattern
Electron Diffraction Pattern