NCMN Central Facilities
Physical Properties
The Physical Properties Facility provides the means for obtaining liquid nitrogen and liquid helium for low-temperature research, cold traps, etc.
Primary Contact:
Steve Michalski, PhD
N102A NANO
(402) 472-7096
smichalski2@unl.edu
Nanofabrication Cleanroom
The Nanofabrication Cleanroom Facility contains a large variety of equipment to prepare, fabricate, analyze, and characterize a wide range of nanostructure materials.
Primary Contact:
Andrei Sokolov, PhD
N102B NANO
402-472-3839
sokolov@unl.edu
Electron Nanoscopy Instrumentation (ENIF)
The scope of this facility is materials characterization of the topography, morphology, elemental composition, crystalline microstructure, crystal defects, and atomic arrangements of materials, largely on a scale from 10 micrometers down to the near-atomic level.
Primary Contact:
Xingzhong "Jim" Li, PhD
033 Jorgensen Hall
(402) 472-8762
xzli@unl.edu
Surface and Materials Characterization (SMCF)
The Surface & Materials Characterization Facility employs a variety of very precise, non-destructive probing techniques (AFM, MFM, EFM, LFM, STM, and PFM) for imaging and measuring surface properties of materials from the micron level down to the atomic scale. This facility also contains a large variety of equipment to characterize the mechanical and physical properties of a wide range of materials and focuses on using the many materials characterization aspects to perform failure analyses on components.
Primary Contact:
Lanping Yue, PhD
013A Jorgensen Hall
402-472-2742
lyue2@unl.edu
Nanomaterials and Thin Films
Two sputtering systems have been established to fabricate a variety of thin films, especially the nano-structured films including overlayers, multilayers, granular solids, clusters, etc. Two tube furnaces are available for sample (target) annealing, doping, and sintering.
Primary Contact:
Steve Michalski, PhD
N102A NANO
(402) 472-7096
smichalski2@unl.edu
X-Ray Structural Characterization (XRSC)
The X-Ray Structural Characterization Facility is dedicated to materials identification and characterization through nondestructive, X-Ray Diffraction (XRD), high-resolution diffraction for analysis of thin films, complete structure determination of single crystals (crystallography).
Primary Contact:
Ather Mahmood, PhD
006A Jorgensen Hall
(402) 472-3693
ather.mahmood@unl.edu
Acknowledgement Text
Agencies, including the NSF and the University of Nebraska-Lincoln, providing partial support of our Nebraska Nanoscale Facilities and Nebraska Center for Materials and Nanoscience Facilities require that the following words be included at the end of any Acknowledgement section of a paper in which experimental work was done in NNF-NCMN facilities:
"The research was performed in part in the Nebraska Nanoscale Facility: National Nanotechnology Coordinated Infrastructure and the Nebraska Center for Materials and Nanoscience (and/or NERCF), which are supported by the National Science Foundation under Award ECCS: 2025298, and the Nebraska Research Initiative."