Central Facilities

NCMN Central Facility for
Scanning Probe and
Materials Charaterization

The NCMN Central Facility for Scanning Probe and Materials Characterization (SPMC) provides state-of-the-art instruments for nanometer-scale characterization of materials surface and physical properties. The SPMC specializes in scanning probe microscopies (SPM) such as Atomic Force Microscopy (AFM), Magnetic Force Microscopy (MFM), Electrostatic Force Microscopy (EFM), Piezoresponse Microscopy (PFM), Scanning Tunneling Microscopy (STM), Surface Potential Microscopy (PeakForce KPFM), PeakForce Tunneling AFM (PF-TUNA) and Quantitative Nanomechanical Property Mapping (PF-QNM).

These SPM instruments have the ability to operate in ambient air, vacuum, liquids, and different temerature environment. AFM can provide three-dimensional high contrast topographic images with sub-nanometer resolution including line width, grain size, thin film thickness, roughness measurements, sectioning of surfaces, particle analysis, surface defects, and pattern recognition, etc. Depending on the interaction of scanning probe and sample surface, a variety of physical properties can be measured such as electrical, magnetic, and nanomechanical properties. 

In addition to the SPM systems, the Facility also offers non-probe based equipment for measuring thermal properties; a Differential Scanning Calorimeter (DSC), a Thermogravimetry Analysis system (TGA), and a polarized microscopic hot stage with a high temperature capability to 375° C and equipment for measuring mechanical properties of various samples.

The Central Facilities are university recharge centers that are open to all UNL researchers as well as external users with well-defined user fees. The SPMC central facility is located in the basement of Jorgensen Hall (Room 013, 011, and 009) at the University of Nebraska-Lincoln.

The SPM Specialist, Dr. Lanping Yue (see Contact Info) is in charge of the SPMC central facility to maintain equipment, teach and assist users in the use of these instruments, analysis techniques and data interpretation and presentation. Research collaborations are welcome from all university research groups as well as companies in Nebraska and elsewhere.

The Facility is Equipped with:


1. Brucker Dimension ICON SPM

Bruker Dimension Icon® Atomic Force Microscope is equipped with ScanAsyst® automatic image optimization mode based on PeakForce Tapping technology, which enables users to obtain consistent high-quality results more easier and faster. This system is capable of many SPM applications (contact mode, tapping mode, ScanAsyst peakforce mode, AFM in fluid, Phase imaging, piezoresponse, and many others.) 

Material Mapping
The Icon SPM supports PeakForce QNM® Imaging Mode, enabling researchers to map and distinguish quantitatively between nanomechanical properties while simultaneously imaging sample topography at high resolution. This technology operates over an extremely wide range (1MPa to 50GPa for modulus and 10pN to 10μN for adhesion) to characterize a large variety of sample types.

Electrical Characterization
Users can arry out electrical characterization at the nanoscale with greater sensitivity and dynamic range using exclusive PeakForce TUNA & PeakForce KPFM modules. Key capabilities:

• Conductivity mapping on the most delicate sample: charges, charge distribution, diffusions, surface potential distribution, etc;
• Correlated quantitative nanomechanical properties (modulus & adhesion);
•Information for rational nanostructure optimization --ID components & their distribution.

Nanomanipulation

Perform indentation, and lithography at the nanometer and molecular scales. The Icon’s XYZ closed-loop scanner provides precise probe positioning with no piezo creep and extremely low noise.  

Heating and Cooling
Execute temperature control and thermal analysis on samples from –35°C to 250°C while scanning in various AFM modes. 

2. EnviroScope Atomic Force Microscope (ESCOPE)

EnviroScope

The Digital Instruments EnviroScope combines AFM imaging with environmental controls and hermetically sealed sample chamber to perform Contact Mode and TappingMode atomic force microscopy in air, vacuum, or a purged gas, as well as a heated environment. With advanced environmental capabilities, users can observe sample reactions to a variety of complex environmental conditions while scanning. 

3. Dimension 3100 SPM system

The Digital Instruments Nanoscope IIIa Dimension 3100 SPM system provides high resolution, 3D images for a large variety of materials, such as nanoparticles, polymers, DNA, semiconductor thin films, magnetic media, optics and other advanced nanostructures.

Dimension 3100 SPM system

MFM image mode can scan samples in external magnetic fields, which is useful for in-situ imaging magnetic domain structures and magnetic switch behavior. The available magnetic devices can supply magnetic fields perpendicular (± 0.25 T) and/or parallel (± 0.35 T) to the sample surface. 

4. DSC and TGA thermal analysis systems

The SPMC facility has two thermal analysis systems: a differential scanning calorimeter (DSC 204 F1 Phoenix) and a thermogravimetry analysis system (TGA 209 F1 Libra).  Both systems operate through a large temperature range -175°C to 700°C for the DSC and 25°C to 1100°C for the TGA.  These systems allow users to study and measure various thermal properties of materials such as; glass-transition temperatures, melting temperatures, melting enthalpy, crystallization temperatures, crystallization enthalpy, transition enthalpies, phase transformations, phase diagrams and other thermal properties.

5. Olympus BX51 polarizing microscope

The SPMC houses an Olympus BX51 polarizing microscope which includes differential interference contrast capabilities for sample viewing, and image analysis.  In addition the thermal behavior of a sample can be observed under the microscope using a Mettler Toledo FP900 thermal system equipped with a FP 82 hot stage with a temperature range of room temperature to 375° C.

6. Other equipment

1)     Tukon 2500 Knoop and Vickers tester

2)     BUEHLER ISOMet 1000 Precision Saw

3)     BUEHLER MiniMet 1000 Grinder-polisher

4)     Sartorius Cubis MSU2.7S-000-DM Microbalance

UNL CAMPUS LOCATIONS MAP

Nebraska Center for Materials and Nanoscience




spm Dr. Lanping Yue

Dr. Lanping Yue, Facility Specialist 










Differential scanning calorimeter
(DSC 204 F1 Phoenix)





Olympus BX51 polarizing microscope

                            

Announcements:
NCMN Facilities Sign-In Calendar

Check with the Specialist for log-in access 

 

Lanping Yue, Facility Specialist
(Primary)

855 N. 16th Street
 Jorgensen Hall, Room 013A
Lincoln, NE 68588-0298

phone: (402) 472-2742
fax: (402) 472-6148
lyue2@unl.edu

 

Xingzhong Li,  Facility Specialist (secondary)

855 N. 16th Street, 
Jorgensen Hall, Room 033
Lincoln, NE 68588-0298

phone: (402) 472-8762
   fax: (402) 472-6148
xzli@unl.edu



Steve Michalski,
Facility Specialist (tertiary)

855 N. 16th Street
  102A Nanoscience Research Center
  Lincoln, NE 68588-0298

phone: (402) 472-7096
    fax: (402) 472-6148
   
smichalski2@unl.edu


Li Tan
 , Faculty Adviser

Nebraska Hall, Room W334
Lincoln, NE 68588-0526

               phone: (402) 472-4018  
               ltan4@unl.edu