Eva Franke-Schubert

Eva Franke-Schubert.

Associate Professor
Electrical and Computer Engineering

E430R Nebraska Hall
Lincoln, NE 68588
(402) 472-1697
  • Dr.rer.nat. (Ph.D.), 1998 University of Leipzig, Germany
  • Diploma, 1994 University of Leipzig Germany

Research Interests
  • Nanofabrication
  • Thin Film Deposition
  • Ion beam processing
  • Chiral materials and Hybrids
  • Material characterization

  • Ion beam technology
  • Thin film preparation and characterization
  • Chiral hybrid materials
  • Electronic materials
  • In situ process monitoring

Selected Publications
  • E. Schubert, "Sub-wavelength antireflection coatings from sculptured thin films", Contrib. Plasma Phys. 47, 545 (2007).
  • E. Schubert, J, Fahlteich, B. Rauschenbach, M. Schubert, M. Lorenz, M. Grundmann, and G. Wagner, "Recrystallisation behaviour of sculptured thin films from silicon", J. Appl. Phys. 100 (2006).
  • E. Schubert, F. Frost, N. Razek, D. Hirsch, A. Schindler, and B. Rauschenbach, "Surface cleaning of GaAs by low-energy hydrogen ion-bombardment", J. Appl. Phys. 97, 54 (2005).
  • E. Schubert, F. Frost, Th. Höche, and B. Rauschenbach, "Nanostructure fabrication by glancing angle ion beam assisted deposition of silicon", App. Phys. A 81, 481 (2005).
  • E. Schubert, F. Frost, B. Ziberi, G. Wagner, H. Neumann, B. Rauschenbach, "Ion beam sputter deposition of soft x-ray Mo/Si multilayer mirrors", J. Vac. Sci. Technol. B 23, 959-965 (2005).
  • E. Franke, M. Schubert, J.A. Woollam, J.-D. Hecht, G. Wagner, H. Neumann, F. Bigl,"In situ ellipsometry growth characterization of dual ion beam deposited boron nitride thin films", J. Appl. Phys., 87, 2593 (2000).
  • E. Franke, C.L. Trimble, J.S. Hale, M.Schubert, J.A. Woollam,"Solid state electrochromic reflectance device for emittance modulation in the infrared spectral region", Appl. Phys. Lett. 77, 930 (2000).

  • E. Schubert, F. Frost, H. Neumann, B. Rauschenbach, B. Fuhrmann, F. Heyroth, J. Rivory, E. Charron, B. Gallas and M. Schubert, "Ion beam assisted growth of sculptured thin films: Structural alignment and optical fingerprints", Adv. Solid State Phys. 46, 309, Springer Series (2007).