John Woollam

John Woollam.

George Holmes Distinguished University Professor
Electrical and Computer Engineering

E430K Nebraska Hall
Lincoln, NE 68588
(402) 472-7501
jwoollam1@unl.edu
Faculty Profile

J.A. Woollam Co., Inc.

J.A. Woollam Fellowships
Education
  • 2004, Doctorate (hon.), Linköping University, Sweden
  • 1967, Ph.D., Solid State Physics, Michigan State University
  • 1978, M.S., Electrical Engineering, Case Western Reserve University
  • 1963, M.S., Physics, Michigan State University
  • 1961, B.A., Liberal Arts, Kenyon College

Research Interests
  • Optical, electrical, and microstructural studies of solids, films, interfacial effects and environmental effects on materials
  • Optical coatings, protective coatings, biomaterials and their interfaces; for example protein interactions on surfaces

Honors and Awards
  • Prem S. Paul Innovator of the Year Award, NUtech Ventures, 2018
  • R.F. Bunshah Award, International Conference on Metallurgical Coatings and Thin Films (ICMCTF), 2017
  • Fellow, National Academy of Inventors, 2014
  • 2013 Prize for Industrial Application of Physics, American Physical Society
  • Fellow, American Vacuum Society, 2006
  • College of Engineering Faculty Service Award, 2006, University of Nebraska-Lincoln
  • Doctorate (hon.), Linköping University, Linköping, Sweden, 2004
  • George Holmes Distinguished Professor, University of Nebraska
  • Fellow, American Physical Society, 1981
  • National Research Council Fellow, 1967
Selected Publications
  • J. Sun, J. Hilfiker, M. Saenger, M. Schubert, J. Woollam, R. Synowicki, “Characterizing Antireflection Coatings on Textured Mono-Crystalline Si with Spectroscopic Ellipsometry”, Proceedings of the 34th IEEE Photovoltaics Specialists, June 8-12, Philadelphia, PA, (2009).
  • T. Hofmann, C.M. Herzinger, T.E. Tiwald, J.A. Woollam, M. Schubert, “Hole diffusion profile in a p-p+ silicon homojunction determined by terahertz and midinfrared spectroscopic ellipsometry”, Applied Physics Letters, 95, No. 3, 032102-1 – 032102-3, (2009).
  • M.F. Saenger, M. Schadel, T. Hofmann, J. Hilfiker, J. Sun, T. Tiwald, M. Schubert, J. A. Woollam, “Infrared ellipsometric characterization of silicon nitride films on textured Si photovoltaic cells”, MRS, Fall, 2009, Volume 1123, pages 1-6. (2009).
  • A. Sarkar, T. Viitala, T. Hofmann, T. Tiwald, J. Woollam, A. Kjerstad, B. Laderian, M. Schubert, “Monitoring Organic Thin Film Growth in Aqueous Solution In-Situ with a Combined Quartz Crystal Microbalance and Ellipsometry”, MRS, Fall 2008, pages 1-7, (2009).
  • D. K. Goyal, G. K. Pribil, J. A. Woollam, A. Subramanian, “Detection of Ultrathin Biological Films Using Vacuum Ultraviolet Spectroscopic Ellipsometry”, Materials Science and Engineering B 149, 26-33 (2008).
  • T. Berlind, G.K. Pribil, D.W. Thompson, J.A. Woollam and H. Arwin, “Effects of ion concentration on refractive indices of fluids measured by the minimum deviation technique”, Physica Status Solidi, Proceedings of ICSE4 (c) 5, No. 5, 1249-1252, (March 2008).
  • H. Arwin, A. Askendahl, P. Tengvall, D.W. Thompson, J.A. Woollam, “Infrared ellipsometry studies of thermal stability of protein monolayers and multilayers” Physica Status Solidi, (c) 5, No. 5, 1438-1441, (2008).
  • L. G. Castro, D.W. Thompson, T.W. Tiwald, E. M. Berberov and J.A. Woollam, “Repeatability of Ellipsometric Data in Cholera Toxin GM1-ELISA Structures”, Surface Science Vol. 601, No. 8, 1795-1803 (2007).
  • W.H. Nosal, D.W. Thompson, T. E. Tiwald, S. Sarkar, A. Subramanian, J.A. Woollam, “Vacuum Ultraviolet Optical Analysis of Spin-Cast Chitosan Films modified by Succinic Anhydride and Glycidyl Phenyl Ether”, Surface and Interface Analysis, Vol. 39, 747-751 (July, 2007).
  • S.M. Aouadi, A. Bohnhoff, T. Amriou, M. Williams, J. N. Hilfiker, N. Singh, J.A. Woollam, “Vacuum ultra-violet spectroscopic ellipsometry study of single-and multi-phase nitride protective films”, J. Phys.: Condens. Matter 18, No. 32, S1691-S1701, (2006).
  • S. Aouadi, Y. Zhang, P. Basnyat, S. Stadler, P. Filip, M. Williams, J.N. Hilfiker, N. Singh, J.A. Woollam, “Physical and Chemical Properties of Sputter-Deposited TaCxNy Films”, J. Phys.: Condens. Matter 18, No. 6, 1977-1986, (February 2006).
  • B.W. Woods, D.W. Thompson, J.A. Woollam, “Cermet Thermal Conversion Coatings for Space Applications”, Protection of Materials and Structures from the Space Environment, Space Technology Proceedings, Vol. 6, ICPMSE-7, 265-276, (2006).
  • W.H. Nosal, D.W. Thompson, L. Yan, S. Sarkar, A. Subramanian, J.A. Woollam, “UV-vis-Infrared Optical and AFM Study of Spin-cast Chitosan Films”, Colloids Surfaces B: Biointerfaces 43, 131-137 (July 2005).
  • J. N. Hilfiker, J.A. Woollam, “Encyclopedia of Modern Optics”, Elsevier Ltd., 297-307 (2005).
  • H. Arwin, L.M. Karlsson, A. Kozarcanin, D.W. Thompson, T.W. Tiwald, J.A. Woollam, “Carbonic Anhydrase Adsorption in Porous Silicon Studied with Infrared Ellipsometry”, 4th Int. Conf. on Porous Semiconductors - Science and Technology (PSST04), Cullera-Valencia, 14-19 March 2004, phys. stat. sol. (a), 202, No. 8, 1688-1692, (June 2005).
  • W.H. Nosal, D.W. Thompson, L. Yan, S. Sarkar, A. Subramanian, J.A. Woollam, “Infrared Optical Properties and AFM of Spin-Cast Chitosan Films Chemically Modified with 1,2 Epoxy-3-Phenoxy-Propane”, Colloids Surfaces B: Biointerfaces 46, No. 1, 26-31, (November 2005).
  • D.W. Thompson and J.A. Woollam “Enhancing infrared response of adsorbed biomaterials using ellipsometry and textured surfaces," Spectroscopy-an International Journal 19, 147-164, (2005).