A state-of-the-art multifunctional low-temperature high-magnetic field scanning probe microscopy (LTHM-SPM) system was installed in NCMN-SMCF recently for nanoscale science and engineering research.
This LTHM-SPM is capable of characterizing spatially resolved conductivity (c-AFM), magnetic force (MFM), piezoresponse (PFM), and topography (AFM) down to the nanoscale.
The unique capabilities of the LTHM-SPM system are imaging various physical properties over a wide temperature range (4 -300 K), and magnetic field range (0-9 T). It will be a powerful tool for materials investigations.